To facilitate the integration of HiPe SenS cameras into any microscopy or system, NIT provides one more option of the HiPe SenS series – the HiPe SenS 640M-ST. Explore how SWIR cameras, particularly NIT HiPe SenS, bring benefits for low light and long exposure time applications (Microscopy, Biomedical, Semiconductor Inspection, […]
Tägliche Archive: 17. Oktober 2020
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